Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Embedded Test Instrument for Intermittent Resistive Fault Detection at ..."

Hassan Ebrahimi, Hans G. Kerkhoff (2021)

> Home

Details and statistics

DOI: 10.1109/DDECS52668.2021.9417064

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-04

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ddecs/EbrahimiK21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ddecs/EbrahimiK21
Hassan Ebrahimi, Hans G. Kerkhoff:
Embedded Test Instrument for Intermittent Resistive Fault Detection at Chip Level and Its Reuse at Board Level. DDECS 2021: 75-80

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.