"Overcoming post-silicon validation challenges through quick error ..."

David Lin et al. (2013)

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DOI: 10.7873/DATE.2013.077

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-25

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  - https://dblp.org/rec/conf/date/LinHLFGHM13
David Lin, Ted Hong, Yanjing Li, Farzan Fallah, Donald S. Gardner, Nagib Hakim, Subhasish Mitra:
Overcoming post-silicon validation challenges through quick error detection (QED). DATE 2013: 320-325

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