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"As-Robust-As-Possible test generation in the presence of small delay ..."

Stephan Eggersglüß, Rolf Drechsler (2011)

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DOI: 10.1109/DATE.2011.5763207

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/date/EggersglusD11
Stephan Eggersglüß, Rolf Drechsler:
As-Robust-As-Possible test generation in the presence of small delay defects using pseudo-Boolean optimization. DATE 2011: 1291-1296

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