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"Bayesian virtual probe: minimizing variation characterization cost for ..."

Wangyang Zhang, Xin Li, Rob A. Rutenbar (2010)

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DOI: 10.1145/1837274.1837342

access: closed

type: Conference or Workshop Paper

metadata version: 2024-03-21

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Wangyang Zhang, Xin Li, Rob A. Rutenbar:
Bayesian virtual probe: minimizing variation characterization cost for nanoscale IC technologies via Bayesian inference. DAC 2010: 262-267

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