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2020 – today
- 2020
[i1]Haiguang Liao, Qingyi Dong, Xuliang Dong, Wentai Zhang, Wangyang Zhang, Weiyi Qi, Elias Fallon, Levent Burak Kara:
Attention Routing: track-assignment detailed routing using attention-based reinforcement learning. CoRR abs/2004.09473 (2020)
2010 – 2019
- 2016
- [j3]Fa Wang, Paolo Cachecho, Wangyang Zhang, Shupeng Sun, Xin Li, Rouwaida Kanj, Chenjie Gu:
Bayesian Model Fusion: Large-Scale Performance Modeling of Analog and Mixed-Signal Circuits by Reusing Early-Stage Data. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(8): 1255-1268 (2016) - 2013
- [j2]Wangyang Zhang, Karthik Balakrishnan, Xin Li, Duane S. Boning, Sharad Saxena, Andrzej J. Strojwas, Rob A. Rutenbar
:
Efficient Spatial Pattern Analysis for Variation Decomposition Via Robust Sparse Regression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(7): 1072-1085 (2013) - [c15]Fa Wang, Wangyang Zhang, Shupeng Sun, Xin Li, Chenjie Gu:
Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data. DAC 2013: 64:1-64:6 - [c14]Wangyang Zhang, Xin Li, Sharad Saxena, Andrzej J. Strojwas, Rob A. Rutenbar:
Automatic clustering of wafer spatial signatures. DAC 2013: 71:1-71:6 - [c13]Chun-Kai Hsu, Fan Lin, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, John M. Carulli, Kenneth M. Butler:
Test data analytics - Exploring spatial and test-item correlations in production test data. ITC 2013: 1-10 - 2012
- [b1]Wangyang Zhang:
IC Spatial Variation Modeling: Algorithms and Applications. Carnegie Mellon University, USA, 2012 - [c12]Xin Li, Wangyang Zhang, Fa Wang:
Large-scale statistical performance modeling of analog and mixed-signal circuits. CICC 2012: 1-8 - [c11]Wangyang Zhang, Amith Singhee, Jinjun Xiong, Peter A. Habitz, Amol Joshi, Chandu Visweswariah, James Sundquist:
A dynamic method for efficient random mismatch characterization of standard cells. ICCAD 2012: 180-186 - [c10]Xin Li, Wangyang Zhang, Fa Wang, Shupeng Sun, Chenjie Gu:
Efficient parametric yield estimation of analog/mixed-signal circuits via Bayesian model fusion. ICCAD 2012: 627-634 - [c9]Wangyang Zhang, Karthik Balakrishnan, Xin Li, Duane S. Boning, Emrah Acar, Frank Liu, Rob A. Rutenbar:
Spatial variation decomposition via sparse regression. ICICDT 2012: 1-4 - 2011
- [j1]Wangyang Zhang, Xin Li, Frank Liu, Emrah Acar, Rob A. Rutenbar, Ronald D. Blanton:
Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(12): 1814-1827 (2011) - [c8]Wenjian Yu, Chao Hu, Wangyang Zhang:
Parallel statistical capacitance extraction of on-chip interconnects with an improved geometric variation model. ASP-DAC 2011: 67-72 - [c7]Wangyang Zhang, Karthik Balakrishnan, Xin Li, Duane S. Boning, Rob A. Rutenbar:
Toward efficient spatial variation decomposition via sparse regression. ICCAD 2011: 162-169 - [c6]Hsiu-Ming Chang, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, Kenneth M. Butler:
Test cost reduction through performance prediction using virtual probe. ITC 2011: 1-9 - 2010
- [c5]Wangyang Zhang, Xin Li, Rob A. Rutenbar:
Bayesian virtual probe: minimizing variation characterization cost for nanoscale IC technologies via Bayesian inference. DAC 2010: 262-267 - [c4]Wangyang Zhang, Tsung-Hao Chen, Ming Yuan Ting, Xin Li:
Toward efficient large-scale performance modeling of integrated circuits via multi-mode/multi-corner sparse regression. DAC 2010: 897-902 - [c3]Wangyang Zhang, Xin Li, Emrah Acar, Frank Liu, Rob A. Rutenbar:
Multi-Wafer Virtual Probe: Minimum-cost variation characterization by exploring wafer-to-wafer correlation. ICCAD 2010: 47-54
2000 – 2009
- 2009
- [c2]Wenjian Yu, Chao Hu, Wangyang Zhang:
Variational capacitance extraction of on-chip interconnects based on continuous surface model. DAC 2009: 758-763 - 2008
- [c1]Wangyang Zhang, Wenjian Yu, Zeyi Wang, Zhiping Yu, Rong Jiang, Jinjun Xiong:
An Efficient Method for Chip-Level Statistical Capacitance Extraction Considering Process Variations with Spatial Correlation. DATE 2008: 580-585
Coauthor Index
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