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"An accurate semi-analytical framework for full-chip TSV-induced stress ..."

Yang Li, David Z. Pan (2013)

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DOI: 10.1145/2463209.2488957

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-03

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  dblp key:
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Yang Li, David Z. Pan:
An accurate semi-analytical framework for full-chip TSV-induced stress modeling. DAC 2013: 181:1-181:8

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