"Design for Testability for Path Delay faults in Sequential Circuits."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Tapan J. Chakraborty, Vishwani D. Agrawal, Michael L. Bushnell (1993)

> Home

Details and statistics

DOI: 10.1145/157485.164973

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/dac/ChakrabortyAB93
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dac/ChakrabortyAB93
Tapan J. Chakraborty, Vishwani D. Agrawal, Michael L. Bushnell:
Design for Testability for Path Delay faults in Sequential Circuits. DAC 1993: 453-457

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.