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"An Integrated Modeling Paradigm of Circuit Reliability for 65nm CMOS ..."
Wenping Wang et al. (2007)
- Wenping Wang, Vijay Reddy, Anand T. Krishnan, Rakesh Vattikonda, Srikanth Krishnan, Yu Cao:
An Integrated Modeling Paradigm of Circuit Reliability for 65nm CMOS Technology. CICC 2007: 511-514
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