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"Comparison of deep learning-based image segmentation methods for the ..."

Tobias Schiele et al. (2021)

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DOI: 10.1109/CASE49439.2021.9551671

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-08

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  - conf/case/SchieleJBKPSH21
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Tobias Schiele, Andreas Jansche, Timo Bernthaler, Anton Kaiser, Daniel Pfister, Stefan Späth-Stockmeier, Christian Hollerith:
Comparison of deep learning-based image segmentation methods for the detection of voids in X-ray images of microelectronic components. CASE 2021: 1320-1325

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