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"Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F ..."

Hiroshi Yamamoto et al. (2018)

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DOI: 10.1109/BCICTS.2018.8551045

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-19

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  - conf/bcicts/YamamotoKUIVBRV18
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  - https://dblp.org/rec/conf/bcicts/YamamotoKUIVBRV18
Hiroshi Yamamoto, Ken Kikuchi, Norihiko Ui, Kazutaka Inoue, Valeria Vadalà, Gianni Bosi, Antonio Raffo, Giorgio Vannini:
Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F Amplifiers. BCICTS 2018: 44-47

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