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"An Effective Methodology for Mixed Scan and Reset Design Based on Test ..."

Hsing-Chung Liang, Chung-Len Lee (1999)

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DOI: 10.1109/ATS.1999.810747

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hsing-Chung Liang, Chung-Len Lee:
An Effective Methodology for Mixed Scan and Reset Design Based on Test Generation and Structure of Sequential Circuits. Asian Test Symposium 1999: 173-178

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