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"Test Pattern Selection and Customization Targeting Reduced Dynamic and ..."

Subhadip Kundu, S. Krishna Kumar, Santanu Chattopadhyay (2009)

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DOI: 10.1109/ATS.2009.35

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Subhadip Kundu, S. Krishna Kumar, Santanu Chattopadhyay:
Test Pattern Selection and Customization Targeting Reduced Dynamic and Leakage Power Consumption. Asian Test Symposium 2009: 307-312

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