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"A DFT Method for RTL Data Paths Based on Partially Strong Testability to ..."

Hiroyuki Iwata et al. (2005)

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DOI: 10.1109/ATS.2005.8

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  - https://dblp.org/rec/conf/ats/IwataYOF05
Hiroyuki Iwata, Tomokazu Yoneda, Satoshi Ohtake, Hideo Fujiwara:
A DFT Method for RTL Data Paths Based on Partially Strong Testability to Guarantee Complete Fault Efficiency. Asian Test Symposium 2005: 306-311

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