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"A Power Reduction Method for Scan Testing in Ultra-Low Power Designs."

Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (2021)

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DOI: 10.1109/ATS52891.2021.00037

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-17

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Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima:
A Power Reduction Method for Scan Testing in Ultra-Low Power Designs. ATS 2021: 141

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