"An IR-Drop Aware Test Pattern Generator for Scan-Based At-Speed Testing."

Po-Fan Hou et al. (2016)

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DOI: 10.1109/ATS.2016.23

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Po-Fan Hou, Yi-Tsung Lin, Jiun-Lang Huang, Ann Shih, Zoe F. Conroy:
An IR-Drop Aware Test Pattern Generator for Scan-Based At-Speed Testing. ATS 2016: 167-172

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