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"Improving Test Pattern Compactness in SAT-based ATPG."

Stephan Eggersglüß, Rolf Drechsler (2007)

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DOI: 10.1109/ATS.2007.14

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-09

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  dblp key:
  - conf/ats/EggersglussD07
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  - https://dblp.org/rec/conf/ats/EggersglussD07
Stephan Eggersglüß, Rolf Drechsler:
Improving Test Pattern Compactness in SAT-based ATPG. ATS 2007: 445-452

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