"A Built-in Self-Test Scheme for Detecting Defects in FinFET-Based SRAM ..."

Meng-Chi Chen, Tsung-Hsuan Wu, Cheng-Wen Wu (2018)

Details and statistics

DOI: 10.1109/ATS.2018.00015

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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