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"Secure and testable scan design using extended de Bruijn graphs."

Hideo Fujiwara, Marie Engelene J. Obien (2010)

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DOI: 10.1109/ASPDAC.2010.5419845

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-02

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  - conf/aspdac/FujiwaraO10
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  persistent URL:
  - https://dblp.org/rec/conf/aspdac/FujiwaraO10
Hideo Fujiwara, Marie Engelene J. Obien:
Secure and testable scan design using extended de Bruijn graphs. ASP-DAC 2010: 413-418

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