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"New electromigration modeling and analysis considering time-varying ..."
Hai-Bao Chen et al. (2015)
- Hai-Bao Chen, Sheldon X.-D. Tan, Xin Huang, Valeriy Sukharev
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New electromigration modeling and analysis considering time-varying temperature and current densities. ASP-DAC 2015: 352-357
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