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"A class of impedance tomography based sensors for semiconductor manufacturing."

Michiel Krüger, Kameshwar Poolla, Costas J. Spanos (2004)

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DOI: 10.23919/ACC.2004.1383784

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-24

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  dblp key:
  - conf/amcc/KrugerPS04
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Michiel Krüger, Kameshwar Poolla, Costas J. Spanos:
A class of impedance tomography based sensors for semiconductor manufacturing. ACC 2004: 2178-2183

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