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"Integrating Deep Learning and Explicit MPC for Advanced Process Control."

Justin Katz et al. (2020)

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DOI: 10.23919/ACC45564.2020.9147582

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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  dblp key:
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  - https://dblp.org/rec/conf/amcc/KatzPAP20
Justin Katz, Iosif Pappas, Styliani Avraamidou, Efstratios N. Pistikopoulos:
Integrating Deep Learning and Explicit MPC for Advanced Process Control. ACC 2020: 3559-3564

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