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"Defect detection based on singular value decomposition and histogram ..."

Xuan Tuyen Tran et al. (2020)

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DOI: 10.1109/AIM43001.2020.9159005

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  - conf/aimech/TranDLZH20
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Xuan Tuyen Tran, Tran Hiep Dinh, Ha Vu Le, Qiuchen Zhu, Quang Phuc Ha:
Defect detection based on singular value decomposition and histogram thresholding. AIM 2020: 1149-1154

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