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"Characterization of local strain around trough silicon via interconnects ..."
Osamu Nakatsuka et al. (2011)
- Osamu Nakatsuka
, Hideki Kitada, Young-Suk Kim, Yoriko Mizushima, Tomoji Nakamura, Takayuki Ohba, Shigeaki Zaima
:
Characterization of local strain around trough silicon via interconnects in wafer-on-wafer structures. 3DIC 2011: 1-4
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