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BibTeX record journals/mr/ZhengHLZ18
@article{DBLP:journals/mr/ZhengHLZ18, author = {Tao Zheng and Meng Huang and Yi Liu and Xiaoming Zha}, title = {Reliability model of bond wire fatigue for {IGBT} in {MMC} with system redundancy consideration}, journal = {Microelectron. Reliab.}, volume = {88-90}, pages = {1164--1167}, year = {2018}, url = {https://doi.org/10.1016/j.microrel.2018.07.099}, doi = {10.1016/J.MICROREL.2018.07.099}, timestamp = {Mon, 15 Feb 2021 08:47:17 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZhengHLZ18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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