BibTeX record journals/mr/StadlerERZGWWQME05

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@article{DBLP:journals/mr/StadlerERZGWWQME05,
  author       = {Wolfgang Stadler and
                  Kai Esmark and
                  K. Reynders and
                  M. Zubeidat and
                  Michael Graf and
                  Wolfgang Wilkening and
                  J. Willemen and
                  Ning Qu and
                  S. Mettler and
                  M. Etherton},
  title        = {Test circuits for fast and reliable assessment of {CDM} robustness
                  of {I/O} stages},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {2},
  pages        = {269--277},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2004.05.014},
  doi          = {10.1016/J.MICROREL.2004.05.014},
  timestamp    = {Wed, 16 Mar 2022 23:54:29 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/StadlerERZGWWQME05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}