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"Test circuits for fast and reliable assessment of CDM robustness of I/O ..."

Wolfgang Stadler et al. (2005)

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DOI: 10.1016/J.MICROREL.2004.05.014

access: closed

type: Journal Article

metadata version: 2022-03-16

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Wolfgang Stadler, Kai Esmark, K. Reynders, M. Zubeidat, Michael Graf, Wolfgang Wilkening, J. Willemen, Ning Qu, S. Mettler, M. Etherton:
Test circuits for fast and reliable assessment of CDM robustness of I/O stages. Microelectron. Reliab. 45(2): 269-277 (2005)

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