BibTeX record journals/mr/RaffoFSMSV11

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@article{DBLP:journals/mr/RaffoFSMSV11,
  author       = {Antonio Raffo and
                  Sergio Di Falco and
                  Giovanna Sozzi and
                  Roberto Menozzi and
                  Dominique M. M.{-}P. Schreurs and
                  Giorgio Vannini},
  title        = {Analysis of the gate current as a suitable indicator for {FET} degradation
                  under nonlinear dynamic regime},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {2},
  pages        = {235--239},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2010.08.010},
  doi          = {10.1016/J.MICROREL.2010.08.010},
  timestamp    = {Mon, 26 Oct 2020 08:59:23 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RaffoFSMSV11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}