BibTeX record journals/mr/LandelGLL16

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@article{DBLP:journals/mr/LandelGLL16,
  author       = {Matthieu Landel and
                  Cyrille Gautier and
                  Denis Labrousse and
                  St{\'{e}}phane Lefebvre},
  title        = {{[131]} Experimental study of the short-circuit robustness of 600
                  {V} E-mode GaN transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {64},
  pages        = {560--565},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.07.042},
  doi          = {10.1016/J.MICROREL.2016.07.042},
  timestamp    = {Sun, 02 Oct 2022 15:44:02 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/LandelGLL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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