BibTeX record journals/ieicet/LiangLHYX17

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@article{DBLP:journals/ieicet/LiangLHYX17,
  author       = {Huaguo Liang and
                  Xin Li and
                  Zhengfeng Huang and
                  Aibin Yan and
                  Xiumin Xu},
  title        = {Highly Robust Double Node Upset Resilient Hardened Latch Design},
  journal      = {{IEICE} Trans. Electron.},
  volume       = {100-C},
  number       = {5},
  pages        = {496--503},
  year         = {2017},
  url          = {https://doi.org/10.1587/transele.E100.C.496},
  doi          = {10.1587/TRANSELE.E100.C.496},
  timestamp    = {Sat, 11 Apr 2020 14:48:00 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/LiangLHYX17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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