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"Highly Robust Double Node Upset Resilient Hardened Latch Design."

Huaguo Liang et al. (2017)

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DOI: 10.1587/TRANSELE.E100.C.496

access: closed

type: Journal Article

metadata version: 2020-04-11

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  dblp key:
  - journals/ieicet/LiangLHYX17
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/LiangLHYX17
Huaguo Liang, Xin Li, Zhengfeng Huang, Aibin Yan, Xiumin Xu:
Highly Robust Double Node Upset Resilient Hardened Latch Design. IEICE Trans. Electron. 100-C(5): 496-503 (2017)

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