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BibTeX record journals/dt/ShoukourianVZ04
@article{DBLP:journals/dt/ShoukourianVZ04, author = {Samvel K. Shoukourian and Valery A. Vardanian and Yervant Zorian}, title = {SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure}, journal = {{IEEE} Des. Test Comput.}, volume = {21}, number = {3}, pages = {200--207}, year = {2004}, url = {https://doi.org/10.1109/MDT.2004.19}, doi = {10.1109/MDT.2004.19}, timestamp = {Sun, 17 May 2020 11:44:09 +0200}, biburl = {https://dblp.org/rec/journals/dt/ShoukourianVZ04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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