"SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure."

Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian (2004)

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DOI: 10.1109/MDT.2004.19

access: closed

type: Journal Article

metadata version: 2020-05-17

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Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure. IEEE Des. Test Comput. 21(3): 200-207 (2004)

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