BibTeX record journals/dt/GirardLPVW02

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@article{DBLP:journals/dt/GirardLPVW02,
  author       = {Patrick Girard and
                  Christian Landrault and
                  Serge Pravossoudovitch and
                  Arnaud Virazel and
                  Hans{-}Joachim Wunderlich},
  title        = {High Defect Coverage with Low-Power Test Sequences in a {BIST} Environment},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {19},
  number       = {5},
  pages        = {44--52},
  year         = {2002},
  url          = {https://doi.org/10.1109/MDT.2002.1033791},
  doi          = {10.1109/MDT.2002.1033791},
  timestamp    = {Sun, 17 May 2020 11:44:17 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/GirardLPVW02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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