BibTeX record conf/vts/PowellBAHP94

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@inproceedings{DBLP:conf/vts/PowellBAHP94,
  author       = {Theo J. Powell and
                  Kenneth M. Butler and
                  Mike Ales and
                  Roy Haley and
                  Mark Perry},
  title        = {Correlating defect level to final test fault coverage for modular
                  structured designs [microcontroller family]},
  booktitle    = {12th {IEEE} {VLSI} Test Symposium (VTS'94), April 25-28, 1994, Cherry
                  Hill, New Jersey, {USA}},
  pages        = {192--196},
  publisher    = {{IEEE} Computer Society},
  year         = {1994},
  url          = {https://doi.org/10.1109/VTEST.1994.292314},
  doi          = {10.1109/VTEST.1994.292314},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/PowellBAHP94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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