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"Correlating defect level to final test fault coverage for modular ..."

Theo J. Powell et al. (1994)

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DOI: 10.1109/VTEST.1994.292314

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/vts/PowellBAHP94
Theo J. Powell, Kenneth M. Butler, Mike Ales, Roy Haley, Mark Perry:
Correlating defect level to final test fault coverage for modular structured designs [microcontroller family]. VTS 1994: 192-196

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