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BibTeX record conf/vlsi-dat/DuttCNT15
@inproceedings{DBLP:conf/vlsi-dat/DuttCNT15, author = {Sunil Dutt and Anshu Chauhan and Sukumar Nandi and Gaurav Trivedi}, title = {Variability-aware parametric yield enhancement via post-silicon tuning of hybrid redundant {MAC} units}, booktitle = {{VLSI} Design, Automation and Test, {VLSI-DAT} 2015, Hsinchu, Taiwan, April 27-29, 2015}, pages = {1--4}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/VLSI-DAT.2015.7114535}, doi = {10.1109/VLSI-DAT.2015.7114535}, timestamp = {Sat, 05 Sep 2020 17:55:36 +0200}, biburl = {https://dblp.org/rec/conf/vlsi-dat/DuttCNT15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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