"Variability-aware parametric yield enhancement via post-silicon tuning of ..."

Sunil Dutt et al. (2015)

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DOI: 10.1109/VLSI-DAT.2015.7114535

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type: Conference or Workshop Paper

metadata version: 2020-09-05

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Sunil Dutt, Anshu Chauhan, Sukumar Nandi, Gaurav Trivedi:
Variability-aware parametric yield enhancement via post-silicon tuning of hybrid redundant MAC units. VLSI-DAT 2015: 1-4

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