BibTeX record conf/itc/TshagharyanHZGG18

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@inproceedings{DBLP:conf/itc/TshagharyanHZGG18,
  author       = {Grigor Tshagharyan and
                  Gurgen Harutyunyan and
                  Yervant Zorian and
                  Anteneh Gebregiorgis and
                  Mohammad Saber Golanbari and
                  Rajendra Bishnoi and
                  Mehdi Baradaran Tahoori},
  title        = {Modeling and Testing of Aging Faults in FinFET Memories for Automotive
                  Applications},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
                  October 29 - Nov. 1, 2018},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/TEST.2018.8624890},
  doi          = {10.1109/TEST.2018.8624890},
  timestamp    = {Tue, 31 Aug 2021 17:59:19 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/TshagharyanHZGG18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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