"Modeling and Testing of Aging Faults in FinFET Memories for Automotive ..."

Grigor Tshagharyan et al. (2018)

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DOI: 10.1109/TEST.2018.8624890

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-31

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Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian, Anteneh Gebregiorgis, Mohammad Saber Golanbari, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications. ITC 2018: 1-10

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