BibTeX record conf/isicir/RebuffatMOML14

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@inproceedings{DBLP:conf/isicir/RebuffatMOML14,
  author       = {Benjamin Rebuffat and
                  Pascal Masson and
                  Jean{-}Luc Ogier and
                  Marc Mantelli and
                  Romain Laffont},
  title        = {Effect of {AC} stress on oxide {TDDB} and trapped charge in interface
                  states},
  booktitle    = {2014 International Symposium on Integrated Circuits (ISIC), Singapore,
                  December 10-12, 2014},
  pages        = {416--419},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/ISICIR.2014.7029500},
  doi          = {10.1109/ISICIR.2014.7029500},
  timestamp    = {Sat, 08 May 2021 14:08:34 +0200},
  biburl       = {https://dblp.org/rec/conf/isicir/RebuffatMOML14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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