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"Effect of AC stress on oxide TDDB and trapped charge in interface states."

Benjamin Rebuffat et al. (2014)

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DOI: 10.1109/ISICIR.2014.7029500

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-08

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  dblp key:
  - conf/isicir/RebuffatMOML14
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  - https://dblp.org/rec/conf/isicir/RebuffatMOML14
Benjamin Rebuffat, Pascal Masson, Jean-Luc Ogier, Marc Mantelli, Romain Laffont:
Effect of AC stress on oxide TDDB and trapped charge in interface states. ISIC 2014: 416-419

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