BibTeX record conf/essderc/ReggianiGGBPWCTD13

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@inproceedings{DBLP:conf/essderc/ReggianiGGBPWCTD13,
  author       = {Susanna Reggiani and
                  Elena Gnani and
                  Antonio Gnudi and
                  Giorgio Baccarani and
                  Stefano Poli and
                  Rick Wise and
                  Ming{-}Yeh Chuang and
                  Weidong Tian and
                  Marie Denison},
  title        = {Modeling and characterization of hot-carrier stress degradation in
                  power MOSFETs (invited)},
  booktitle    = {Proceedings of the European Solid-State Device Research Conference,
                  {ESSDERC} 2013, Bucharest, Romania, September 16-20, 2013},
  pages        = {91--94},
  publisher    = {{IEEE}},
  year         = {2013},
  url          = {https://doi.org/10.1109/ESSDERC.2013.6818826},
  doi          = {10.1109/ESSDERC.2013.6818826},
  timestamp    = {Wed, 05 May 2021 08:50:07 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/ReggianiGGBPWCTD13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}