BibTeX record conf/essderc/LuongSTBTPMZ17

• > Home > conf/essderc/LuongSTBTPMZ17

@inproceedings{DBLP:conf/essderc/LuongSTBTPMZ17,
  author       = {Gia Vinh Luong and
                  Sebastiano Strangio and
                  Andreas T. Tiedemann and
                  Patric Bernardy and
                  Stefan Trellenkamp and
                  Pierpaolo Palestri and
                  Siegfried Mantl and
                  Qing{-}Tai Zhao},
  title        = {Experimental characterization of the static noise margins of strained
                  silicon complementary tunnel-FET {SRAM}},
  booktitle    = {47th European Solid-State Device Research Conference, {ESSDERC} 2017,
                  Leuven, Belgium, September 11-14, 2017},
  pages        = {42--45},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ESSDERC.2017.8066587},
  doi          = {10.1109/ESSDERC.2017.8066587},
  timestamp    = {Thu, 29 Sep 2022 08:36:56 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/LuongSTBTPMZ17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}