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"Experimental characterization of the static noise margins of strained ..."

Gia Vinh Luong et al. (2017)

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DOI: 10.1109/ESSDERC.2017.8066587

access: closed

type: Conference or Workshop Paper

metadata version: 2022-09-29

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Gia Vinh Luong, Sebastiano Strangio, Andreas T. Tiedemann, Patric Bernardy, Stefan Trellenkamp, Pierpaolo Palestri, Siegfried Mantl, Qing-Tai Zhao:
Experimental characterization of the static noise margins of strained silicon complementary tunnel-FET SRAM. ESSDERC 2017: 42-45

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