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Mimi Yiu

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Journal Articles

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2007
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Mimi Yiu, Chris Winstead, Vincent C. Gaudet, Christian Schlegel:
Design for Testability of CMOS Analog Sum-Product Error-Control Decoders. IEEE Trans. Circuits Syst. II Express Briefs 54-II(8): 675-679 (2007)

Conference and Workshop Papers

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2005
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Mimi Yiu, Chris Winstead, Vincent C. Gaudet, Christian Schlegel:
Digital built-in self-test of CMOS analog iterative decoders. ISCAS (3) 2005: 2204-2207

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