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"Design for Testability of CMOS Analog Sum-Product Error-Control Decoders."

Mimi Yiu et al. (2007)

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DOI: 10.1109/TCSII.2007.898472

access: closed

type: Journal Article

metadata version: 2020-05-27

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Mimi Yiu, Chris Winstead, Vincent C. Gaudet, Christian Schlegel:
Design for Testability of CMOS Analog Sum-Product Error-Control Decoders. IEEE Trans. Circuits Syst. II Express Briefs 54-II(8): 675-679 (2007)

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