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Ravindra P. Saraf

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2000 – 2009

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2004
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Rajeshwar S. Sable, Ravindra P. Saraf, Rubin A. Parekhji, Arun N. Chandorkar:
Built-in Self-test Technique for Selective Detection of Neighbourhood Pattern Sensitive Faults in Memories. VLSI Design 2004: 753-756

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