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Bill Infantolino

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2000 – 2009

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2008
[j1]
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Changsoo Jang, Seungbae Park, Bill Infantolino, Lawrence Lehman, Ryan Morgan, Dipak Sengupta:
Failure analysis of contact probe pins for SnPb and Sn applications. Microelectron. Reliab. 48(6): 942-947 (2008)

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