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Eric Kwang Joo Sim

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Journal Articles

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2013
[j2]
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  - journals/dt/OoiSKCSDC13
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  - https://dblp.org/rec/journals/dt/OoiSKCSDC13
Melanie Po-Leen Ooi, Hong Kuan Sok, Ye Chow Kuang, Huiyuan Cheng, Eric Kwang Joo Sim, Serge N. Demidenko, Chris W. K. Chan:
Identifying Systematic Failures on Semiconductor Wafers Using ADCAS. IEEE Des. Test 30(5): 44-53 (2013)
2011
[j1]
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  - journals/tim/OoiSKDKC11
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Melanie Po-Leen Ooi, Eric Kwang Joo Sim, Ye Chow Kuang, Serge N. Demidenko, Lindsay Kleeman, Chris W. K. Chan:
Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction. IEEE Trans. Instrum. Meas. 60(10): 3300-3317 (2011)

Conference and Workshop Papers

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2011
[c1]
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  - conf/delta/ChengOKSCD11
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Huiyuan Cheng, Melanie Po-Leen Ooi, Ye Chow Kuang, Eric Kwang Joo Sim, Bryan Cheah, Serge N. Demidenko:
Automatic Yield Management System for Semiconductor Production Test. DELTA 2011: 254-258

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