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"Automatic Yield Management System for Semiconductor Production Test."

Huiyuan Cheng et al. (2011)

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DOI: 10.1109/DELTA.2011.53

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/delta/ChengOKSCD11
Huiyuan Cheng, Melanie Po-Leen Ooi, Ye Chow Kuang, Eric Kwang Joo Sim, Bryan Cheah, Serge N. Demidenko:
Automatic Yield Management System for Semiconductor Production Test. DELTA 2011: 254-258

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